Wafer Map Pro - User Manual

Welcome to the Wafer Map Pro User Manual. This guide provides detailed instructions on how to use both the Wafer Map Editor and the Wafer Map Comparator.

Part 1: Wafer Map Editor

The Editor allows you to visualize, edit, and analyze a single wafer map file.

1.1 - Getting Started

Navigate to the Editor: Open your web browser and go to the root URL (e.g., http://127.0.0.1:5000).
Upload a File:
- Drag and drop your .txt wafer map file onto the designated area.
- Alternatively, click the area to open a file selection dialog.
Define Bin Codes:
- After uploading, the application automatically detects all unique characters in your file.
- For each character, use the dropdown menu to assign its bin type. The available types are:
  - Good: Represents a functional die.
  - NG (No Good): Represents a failed die.
  - Dummy: Represents a non-functional die used for structural purposes.
  - Ignore: Represents areas outside the wafer boundary. These will not be rendered on the map.
Generate Map: Once all characters are defined, click the "Generate Map" button. Your wafer map will be rendered on the canvas.

1.2 - Interacting with the Map

Pan: Click and hold the left mouse button anywhere on the map and drag to move it around.
Zoom: Use the mouse wheel to zoom in and out. The zoom is centered on your mouse cursor's position.

1.3 - Editing Tools

Selection

Single Select: Click on any single die to select it. It will be highlighted.
Multi-Select: Hold down the Ctrl key and click on multiple dies to select them individually.
Region Select (Box Select): Hold down the Shift key, then click and drag the mouse to draw a rectangle. All dies within the rectangle will be selected.

Modifying Bins

Once you have one or more dies selected, use the "Edit Bin Code" buttons (Good, NG, Dummy) on the sidebar to change the bin code of all selected dies.

1.4 - Transformation Tools

Rotate: Click the "Rotate 90°" button to rotate the entire wafer map 90 degrees clockwise.
Inset:
1. Click the "Inset" button.
2. A dialog will appear. Enter the number of layers you want to inset from the edge.
3. Select the "From Bin" (the bin type you want to change) and the "To Bin" (the bin type you want to change to).
4. Click "Apply Inset". The tool will identify the outer N layers of the specified "From Bin" and change them to the "To Bin".

1.5 - History and Data

Undo/Redo: Use the "Undo" and "Redo" buttons to step through your changes.
Reset: Click "Reset" to revert the map to its original, freshly-loaded state.
Bin Code Counts: The sidebar displays a real-time count of each bin type on the map. This updates automatically after every edit.
Download: When you are finished, click the "Download .txt" button to save the modified wafer map to a new .txt file.

Part 2: Wafer Map Comparator

The Comparator tool allows you to align and compare multiple wafer maps to find differences.

2.1 - Getting Started

Navigate to the Comparator: Open your web browser and go to the /compare URL (e.g., http://127.0.0.1:5000/compare).
Upload Files: Click the upload area and select two or more .txt wafer map files for comparison.
Define Bin Codes: Just like in the editor, assign a bin type for each unique character found across all uploaded files.
Generate Maps: Click "Generate Maps". The individual maps will be displayed side-by-side.

2.2 - Alignment and Comparison

Set Reference Points: For each map, you must set a reference point for alignment. Click on a die that should correspond to the same location on the other maps. The selected reference die will be marked.
- If a map is oriented differently, use the "Rotate" button beneath it to align it correctly before setting the reference point.
- To change a reference point, simply click a different die. To clear it, use the "Clear Reference" button.
Run Comparison: Once a reference point is set for all maps, click the "Run Comparison" button.

2.3 - Interpreting the Results

A new, combined map will be generated with the following color code:

Green (Match - Good): All maps have a "Good" die at this location.
Blue (Match - NG): All maps have an "NG" die at this location.
Gray (Match - Dummy): All maps have a "Dummy" die at this location.
Red (Mismatch): The maps have different bin codes (e.g., one is Good, another is NG) at this location.
Yellow (Partial Data): One or more maps have data at this location, but at least one map does not (it's outside its boundary).
Dark Gray (No Data): This location is outside the boundaries of all aligned maps.

Detailed View: Hover your mouse over any die on the result map to see a tooltip. This tooltip shows the filename and the specific bin status for each map at that exact location, making it easy to identify the source of any mismatches or partial data.

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