# Wafer Map Pro - User Manual

Welcome to the Wafer Map Pro User Manual. This guide provides detailed instructions on how to use both the **Wafer Map Editor** and the **Wafer Map Comparator**.

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## Part 1: Wafer Map Editor

The Editor allows you to visualize, edit, and analyze a single wafer map file.

### 1.1 - Getting Started

1.  **Navigate to the Editor**: Open your web browser and go to the root URL (e.g., `http://127.0.0.1:5000`).
2.  **Upload a File**: 
    - Drag and drop your `.txt` wafer map file onto the designated area.
    - Alternatively, click the area to open a file selection dialog.
3.  **Define Bin Codes**:
    - After uploading, the application automatically detects all unique characters in your file.
    - For each character, use the dropdown menu to assign its bin type. The available types are:
        - **Good**: Represents a functional die.
        - **NG** (No Good): Represents a failed die.
        - **Dummy**: Represents a non-functional die used for structural purposes.
        - **Ignore**: Represents areas outside the wafer boundary. These will not be rendered on the map.
4.  **Generate Map**: Once all characters are defined, click the **"Generate Map"** button. Your wafer map will be rendered on the canvas.

### 1.2 - Interacting with the Map

- **Pan**: Click and hold the left mouse button anywhere on the map and drag to move it around.
- **Zoom**: Use the mouse wheel to zoom in and out. The zoom is centered on your mouse cursor's position.

### 1.3 - Editing Tools

#### Selection
- **Single Select**: Click on any single die to select it. It will be highlighted.
- **Multi-Select**: Hold down the `Ctrl` key and click on multiple dies to select them individually.
- **Region Select (Box Select)**: Hold down the `Shift` key, then click and drag the mouse to draw a rectangle. All dies within the rectangle will be selected.

#### Modifying Bins
- Once you have one or more dies selected, use the **"Edit Bin Code"** buttons (`Good`, `NG`, `Dummy`) on the sidebar to change the bin code of all selected dies.

### 1.4 - Transformation Tools

- **Rotate**: Click the **"Rotate 90°"** button to rotate the entire wafer map 90 degrees clockwise.
- **Inset**:
    1.  Click the **"Inset"** button.
    2.  A dialog will appear. Enter the number of **layers** you want to inset from the edge.
    3.  Select the **"From Bin"** (the bin type you want to change) and the **"To Bin"** (the bin type you want to change to).
    4.  Click **"Apply Inset"**. The tool will identify the outer N layers of the specified "From Bin" and change them to the "To Bin".

### 1.5 - History and Data

- **Undo/Redo**: Use the **"Undo"** and **"Redo"** buttons to step through your changes.
- **Reset**: Click **"Reset"** to revert the map to its original, freshly-loaded state.
- **Bin Code Counts**: The sidebar displays a real-time count of each bin type on the map. This updates automatically after every edit.
- **Download**: When you are finished, click the **"Download .txt"** button to save the modified wafer map to a new `.txt` file.

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## Part 2: Wafer Map Comparator

The Comparator tool allows you to align and compare multiple wafer maps to find differences.

### 2.1 - Getting Started

1.  **Navigate to the Comparator**: Open your web browser and go to the `/compare` URL (e.g., `http://127.0.0.1:5000/compare`).
2.  **Upload Files**: Click the upload area and select two or more `.txt` wafer map files for comparison.
3.  **Define Bin Codes**: Just like in the editor, assign a bin type for each unique character found across all uploaded files.
4.  **Generate Maps**: Click **"Generate Maps"**. The individual maps will be displayed side-by-side.

### 2.2 - Alignment and Comparison

1.  **Set Reference Points**: For each map, you must set a reference point for alignment. Click on a die that should correspond to the same location on the other maps. The selected reference die will be marked.
    - If a map is oriented differently, use the **"Rotate"** button beneath it to align it correctly *before* setting the reference point.
    - To change a reference point, simply click a different die. To clear it, use the **"Clear Reference"** button.
2.  **Run Comparison**: Once a reference point is set for all maps, click the **"Run Comparison"** button.

### 2.3 - Interpreting the Results

A new, combined map will be generated with the following color code:

- **Green (Match - Good)**: All maps have a "Good" die at this location.
- **Blue (Match - NG)**: All maps have an "NG" die at this location.
- **Gray (Match - Dummy)**: All maps have a "Dummy" die at this location.
- **Red (Mismatch)**: The maps have different bin codes (e.g., one is Good, another is NG) at this location.
- **Yellow (Partial Data)**: One or more maps have data at this location, but at least one map does not (it's outside its boundary).
- **Dark Gray (No Data)**: This location is outside the boundaries of all aligned maps.

**Detailed View**: Hover your mouse over any die on the result map to see a tooltip. This tooltip shows the filename and the specific bin status for each map at that exact location, making it easy to identify the source of any mismatches or partial data.